First principles investigations of mechanical and thermal properties of silicon oxide-silicon ion implanted titanium interface
Editorial: American Institute of Chemical Engineers
ISBN: 0816908397, 9780816908394
Año de publicación: 2001
Congreso: International Conference on Foundations of Molecular Modeling and Simulation: (1st : July 23-28, 2000 : Keystone)
Tipo: Aportación congreso